Reliability Allocation Methods

Abstract

Kirk and Fred discuss reliability allocations for individual components and subsystems.

Key Points

Join Kirk and Fred as they discuss a question from one of our listeners and why solid state electronics and mechanical systems have significant differences in the intrinsic life entitlements and have to be analyzed with different models that may be available.

Topics include:

• Knowing what the intrinsic life of a component in a new application is difficult if not to predict, but in power electronics there are some wear out mechanisms as seen in IGBT (Insulated Gate Bipolar Transistors) and batteries do wear out before the systems are technologically obsolete.
• There are many variables in the life estimate of a component subsystems such as manufacturing, multiple suppliers, and variation in end-use environments that would take significant effort and time to test for.
• HALT and Accelerated life testing (ALT) have different goals, where HALT can empirically expose a products fatigue weaknesses, and ALT is to quantify the time to failures, but ALT typically takes longer with more samples.
• Prognostic and Health Management (PHM) have become a more significant method in electronics life measurement and is based on finding leading parametric measurements that indicate component degradation and eventual wear out.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

Show Notes

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled  “Reliability Prediction – Continued Reliance on a Misleading Approach”. It is in the public domain, so please distribute freely. Trying to predict reliability for development is a misleading and costly approach.

You can now purchase the most recent recording of Kirk Gray’s Hobbs Engineering 8 (two 4 hour sessions) hour Webinar “Rapid and Robust Reliability Development 2022 HALT & HASS Methodologies Online Seminar” from this link.

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.

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